TestForum 2004

Updated 2005 February 01

TestForum 2004
November 30 - December 1, 2004, at Vår Gård, Saltsjöbaden, Sweden

TestForum is an annual event that Nordic Test Forum (NTF) runs every fall/early winter. NTF also runs 2 to 3 thematic events during a year, but these are focused events addressing basically only one topic area, each in the area of test and inspection of electronics, whereas TestForum typically has 3-thematic areas and cover the broader balance of test and inspection as well.

This year the number of attendants where around 70 and came from the Nordic countries as well as from Germany, Great Britain, France, The Netherlands and the USA.

TestForum 2004 comprises three main topics;

Functional test including RF test
Structural test including updates on important Boundary Scan related standards
Test strategies and test economies

PROGRAMME

NTF04 -- 30 November - 1 December 2004
Day 1
Time	Title	Presenter
08:30	NTF Annual General Assembly	For members and all interested
10:00	Registration
10:30	Welcome/Introduction	Knut Båtstoløkken, Kitron Gunnar Carlsson, Ericsson
10:40	Key Note Session	Chairman: Knut Båtstoløkken
10:40	Economics of Testing	Michael Wahl, University of Siegen
11:30	Test challenges and Changes	Bernard Sutton, Independent
12:15	Exhibition and Lunch
13:45	Functional Test	Chairman: Gunnar Carlsson
13:45	Functional Test Objectives and Methods	Hans Högberg, Ericsson
14:15	Mixed Signal Instruments for Coherent Test Applications	Johan Olsson, National Instruments
14:45	Challenges in Integrating RF Test Applications	Birger Schneider, microLEX Syst.
15:15	Coffee Break
15:45	RF Test	Chairman: Birger Schneider
15:45	A Modular Instrument Approach	Patrik Stenvard, Ericsson
16:15	Bluetooth Radio Test and Qualification	Ragnar Lindholm, Rhode & Schwarz
16:45	Bluetooth test solution	Magnus Björk Elcoteq Tallinn
17:15	Fruit & Refreshments
17:45	News from Conferences	Michael J. Smith, Pete Collins
18:15	Should Functional Test Patch the Holes in the Process Control and Test?	Panel moderator: Birger Schneider
20:00	Dinner
21:30	Social get-together
Day 2
Time	Title	Presenter
08:30	Structural Test	Chairman: Bengt Magnhagen
09:00	AOI/AXI	Michael J. Smith Teradyne
08:30	Using Flying prober and Boundary Scan	Saeed Taheri, Acculogic
09:30	The Impact of Low Voltage Technologies on In-Circuit Test	Michael J. Smith Teradyne
10:00	Coffee Break
10:30	Standards Update	Chairman: Mick Austin
10:30	Mixed signal Boundary Scan, reality or myth?	Pete Collins, JTAG Technologies
11:00	Advanced Digital Signal Boundary-scan (1149.6)	Ken Filliter, National Semiconductor
11:30	P1500, a Standard for System on Chip DFT	Kim Petersén, HDC
12:00	Lunch
13:30	Test Strategies Test Economics and Advanced Test Techniques	Chairman: Knut Båtstoløkken
13:30	Using Boundary Scan Emulation for Functional Verification	Johan Rehnberg, ISS Group
14:00	Calculation of Board Test Coverage	Christophe Lotz, ASTER Ingenierie
14:30	Coffee Break
15:00	Strategist - A Test Strategy Tool	Michael J. Smith TeradyneDavid
15:30	System Control of Remote Boundary Scan over I2C/IPMB	Gunnar Carlsson, Ericsson
16:00	Test Forum Close	Knut Båtstoløkken

The first key note speaker was Michael Wahl from the University of Siegen, who spoke about Economics of Testing. Michael gave us interesting thoughts, based on his wide experience within the fields of Design for Testability and its economy.

Michael Wahl, University of Siegen, Key Note Speaker No 1

Bernard Sutton, now an independant consultant (earlier Teradyne) spoke about the impact of lead-free soldering on test. This is an area of retest interest because the EU-directives tells us to get rid of "all lead" in our electronic products at July 2006, at the latest! Later on in the conference programme, Bernard presented new ideas in the area of structural testing.

Michael J. Smith, Teradyne, was very active and entusiastic during the conference. His presentations included AOI/AXI comments on news and strategies in the area of Inspection. Another interesting presentation from Michael was about the Test strategy tool from Teradyne, "Strategist". The software package will decrease the time to market and handle the questions about Time to volume.